Detection of surface mount tantalum capacitors with marginal connections
DOI:
https://doi.org/10.33064/iycuaa2015643593Abstract
Surface mount capacitors are part of a variety of widespread electronic devices such as mobile phones, televisions, electronic boards, etc. These capacitors may have marginal connection between the junctions of internal elements, which can lead to
malfunction or damage to the electronic device. In this paper, a system capable of detecting a marginal connection at different percentages in capacitors efficiently and effectively is presented. Experimental results show that it is possible to detect marginal connections by measuring the temperature at the terminals of capacitor operating under electrical stress conditions.
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De páginas electrónicas
• QAZI, J. An Overview of Failure Analysis of Tantalum Capacitors. Electronic Device Failure Analysis, ASM International, 16(2): 18-23, 2014. Recuperado de http://www.kemet.com/Lists/TechnicalArticles/Attachments/199/2014%20EDFA%20Tantalum%20Cap%20Failure%20Analysis%20Review%20by%20Javaid%20Qazi.pdf
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Copyright (c) 2015 Sergio Isauro Flores Vázquez, Juan López Hernández, José Amparo Rodríguez García, Enrique Martínez Peña, Enrique Rocha Rangel, Eddie Nahúm Armendáriz Mireles, Karla Guadalupe Martínez González, Héctor Chávez García
This work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Las obras publicadas en versión electrónica de la revista están bajo la licencia Creative Commons Atribución-NoComercial-CompartirIgual 4.0 Internacional (CC BY-NC-SA 4.0)
